When Bad News Become Good News: Towards Usable Instances of Learning with Physical Errors. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2022, n. 4, p. 1–24, 2022. DOI: 10.46586/tches.v2022.i4.1-24. Disponível em: https://bmt.ub.rub.de/index.php/TCHES/article/view/9811.. Acesso em: 20 nov. 2024.