The Curse of Class Imbalance and Conflicting Metrics with Machine Learning for Side-channel Evaluations. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2019, n. 1, p. 209–237, 2018. DOI: 10.13154/tches.v2019.i1.209-237. Disponível em: https://bmt.ub.rub.de/index.php/TCHES/article/view/7339.. Acesso em: 20 nov. 2024.